10.14489/td.2014.12.pp.015-018

2014, 12 December

DOI: 10.14489/td.2014.12.pp.015-018

Bukley A.A., Klyuev V.V., Parshin I.A.
NEW INSPECTION MONITORS COMPLEXES ON THE BASIS OF REGISTRATION OF BACKSCATTERED X-RAY
(pp. 15-18)

Abstract. X-ray systems are used for a wide range of tasks in the field of security inspection of baggage and personal items, inspection of vehicles, personal inspection, examination of orphan objects, industrial safety (control of castings, honeycomb structures). To obtain an image in such complexes using the method of X-raying, which requires two-way access to the object of the inspection, which in some cases limits the application.

Keywords: X-ray translucent complex, scattered radiation, the registration of the backscattered x-ray radiation dose, in-spection, touch-screen display.

+ - About the Authors Click to collapse

А. A. Bukley, V. V. Klyuev, I. A. Parshin
RII MSIA «SPECTRUM»; «Flashelectronics» Ltd, Moscow, Russia. E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

+ - References Click to collapse

1. Blokhin E. O., Parshin I. A., Shurushkin A. V. et al. (2012). X-ray systems based on recording gear and backscatter. Kontrol'. Diagnostika, (12), pp. 4-7.
2. Kliuev V.V. (Ed.), Artem'ev B. V., Buklei A. A. (2011). X-ray inspection. Moscow: Izdatel'skii dom "Spektr".

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