Журнал Российского общества по неразрушающему контролю и технической диагностике
The journal of the Russian society for non-destructive testing and technical diagnostic
 
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30 | 04 | 2024
2020, 04 April

DOI: 10.14489/td.2020.04.pp.046-051

Artemyeva O. B., Artemiev B. V., Galkin D. I., Potrakhov N. N.
VI ALL-RUSSIAN SCIENTIFIC AND PRACTICAL CONFERENCE OF X-RAY EQUIPMENT MANUFACTURERS
(pp. 46-51)

Abstract. A brief overview of the most interesting reports and events held on November 28–29, 2019 at the St. Petersburg State Electrotechnical University "VI All-Russian Scientific and Practical Conference of X-ray Manufacturers" is presented. As a result of the work, a collection of conference materials was released. The central event of the conference was an excursion to the plant of JSC Svetlana-X-ray, where the general director is Ph.D. N. A. Kulikov spoke in detail about the existing production technologies and plans for the future, after which a tour was conducted on all the shops of the enterprise. The conference reports were divided into two areas: “Technical means of medical diagnostics” and “Methods of using technical means of medical diagnostics”, although some reports did not fully comply with the aforementioned topics. The conference organizers consciously took such a step so as not to split the meetings into a large number of sections. The most interesting and informative reports were made on the section “Technical means”. For novice researchers and graduate students of Russian universities, special conditions were created that allowed them to participate in the conference with their own reports. More information about the conference materials can be found on the website http://www.x-ray-conf.ru/, which contains the materials of all previous conferences starting from the first All-Russian Conference of X-ray Equipment Manufacturers held in St. Petersburg on November 21, 2014.

Keywords: X-ray equipment, diagnostics, therapy, microfocus emitters, scanning objects.

O. B. Artemyeva, B. V. Artemiev (Moscow State Technical University N. E. Bauman, Moscow, Russia)  E-mail:  Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.
D. I. Galkin (CJSC NIIIN MNPO “SPECTRUM”, Moscow, Russia)  E-mail:  Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.
N. N. Potrakhov (St. Petersburg State Electrotechnical University, St. Petersburg, Russia) E-mail:  Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

 

1.VI All-Russian scientific and practical conference of manufacturers of x-ray equipment. Program and conference materials. Saint Petersburg: Izdatel'stvo SPbGETU «LETI». [in Russian language]

 

 

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