Журнал Российского общества по неразрушающему контролю и технической диагностике
The journal of the Russian society for non-destructive testing and technical diagnostic
 
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12 | 07 | 2025
2025, 07 July

DOI: 10.14489/td.2025.07.pp.061-066

 

Radaev O. A., Frolov I. V., Sergeev V. A., Zaitsev S. A.
COMPARISON OF LED REJECTION METHODS BY THRESHOLD CURRENT AND VOLTAGE DROP
(pp. 61-66)

Abstract. The results of a study of correlations between the values of the threshold current and the forward voltage drop at a given current with the rate of decrease in the radiation power of InGaN/GaN LEDs during long-term tests are presented. According to the selected rejection criterion, the efficiency of LED rejection was compared according to the specified parameters. It has been found that when rejecting LEDs by threshold current, the probability of errors of the first and second kind is significantly lower compared to the standard method of direct voltage drop rejection.

Keywords: LED, threshold current, forward voltage drop, rejection, testing, efficiency.

O. A. Radaev, I. V. Frolov (Ulyanovsk Branch of the Kotelnikov Institute of Radioengineering and Electronics of Russian Academy of Sciences, Ulyanovsk, Russia)
V. A. Sergeev (Ulyanovsk Branch of the Kotelnikov Institute of Radioengineering and Electronics of Russian Academy of Sciences, Ulyanovsk, Russia, Ulyanovsk State Technical University, Ulyanovsk, Russia)
S. A. Zaitsev (Ulyanovsk Instrument Manufacturing Design Bureau, Ulyanovsk, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.

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