Журнал Российского общества по неразрушающему контролю и технической диагностике
The journal of the Russian society for non-destructive testing and technical diagnostic
 
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09 | 03 | 2026
2026, 03 March

DOI: 10.14489/td.2026.03.pp.024-032

Vasilyeva L. A., Boychuk M. I., Demin S. А., Vlasov K. V., Mikaeva S. A.
DEFECTS IN THE MANUFACTURE OF HIGH-FREQUENCY MICROMINIATURE STRIP CRYSTAL ELEMENTS
(pp.24-32)

Abstract. The paper considers defects in the manufacture of high-frequency strip crystal elements in the frequency range from 40 to 70 MHz used for resonators in 2.5×2.0 mm SMD housings, developed at the LIT-PHONON JSC enterprise. The standard manufacturing technology of strip crystal elements is given. Its disadvantages for the manufacture of high-frequency crystal elements with a size of 1.6×1.2 mm have been revealed. Using the new technology of the identified defects, high-frequency group plates were manufactured with a frequency close to the nominal frequency, taking into account the tolerance of the crystalline elements. The technological operation of gluing group plates into bags for subsequent sawing using a domestic hot-melt adhesive, which reduces the time of the technological process, is considered. The operation of automatic sorting of crystalline elements by frequency is considered. This technology makes it possible to measure crystal elements offline with high performance and to carry out their frequency sorting by frequency with a given step. In the course of the work, possible defects in mechanical shaping and their causes were identified. The raw material defects are considered.

Keywords: defects, crystal element, quartz resonator, technological process, chemical etching.

L. A. Vasilyeva, M. I. Boychuk, S. А. Demin, K. V. Vlasov (Object of action “LIT-FONON”, Moscow, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. , Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. , Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра. , Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.
S. A. Mikaeva (RTU-MIREA, Moscow, Russia) E-mail: Данный адрес e-mail защищен от спам-ботов, Вам необходимо включить Javascript для его просмотра.  

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